Sylvain Dudit

	2011
9		Philippe Galy, J. Bourgeat, J. Jimenez, B. Jacquier, D. Marin-Cudraz, Sylvain Dudit: Reliability impact due to high current, lattice and hot carriers temperatures on β(2×2) matrix ESD power devices for advanced CMOS technologies. Microelectronics Reliability 51(9-11): 1608-1613 (2011)
8		G. Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis: Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis. Microelectronics Reliability 51(9-11): 1640-1645 (2011)
7		Thierry Parrassin, Guillaume Celi, Sylvain Dudit, Michel Vallet: Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulation. Microelectronics Reliability 51(9-11): 1646-1651 (2011)
6		Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet: LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. Microelectronics Reliability 51(9-11): 1662-1667 (2011)
	2010
5		Philippe Galy, Sylvain Dudit, Michel Vallet, Ph. Larre, M. Bilinski, E. Petit, J. Beltritti, A. Dray, J. Jimenez, F. Jezequel, R. Chevallier, C. Boutonnat, V. Varo: Inventory of silicon signatures induced by CDM event on deep sub-micronic CMOS-BICMOS technologies. Microelectronics Reliability 50(9-11): 1388-1392 (2010)
4		Philippe Perdu, Jerome Di-Battista, Sylvain Dudit, Tomonori Nakamura: VLSI functional analysis by dynamic emission microscopy. Microelectronics Reliability 50(9-11): 1431-1435 (2010)
3		Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet: Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). Microelectronics Reliability 50(9-11): 1499-1505 (2010)
	2009
2		Philippe Galy, Sylvain Dudit, Michel Vallet, C. Richier, Christophe Entringer, F. Jezequel, E. Petit, J. Beltritti: Impact and damage on deep sub-micron CMOS technology induced by substrate current due to ESD stress. Microelectronics Reliability 49(9-11): 1107-1110 (2009)
	2005
1		M. Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit: Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectronics Reliability 45(9-11): 1476-1481 (2005)

Coauthor Index

1	G. Bascoul	[8]
2	Emmanuel Bechet	[3]
3	J. Beltritti	[2] [5]
4	A. Benigni	[8]
5	M. Bilinski	[5]
6	J. Bourgeat	[9]
7	C. Boutonnat	[5]
8	Guillaume Celi	[3] [6] [7] [8]
9	R. Chevallier	[5]
10	Romain Desplats	[1]
11	Jerome Di-Battista	[4]
12	A. Dray	[5]
13	Christophe Entringer	[2]
14	Philippe Galy	[2] [5] [9]
15	B. Jacquier	[9]
16	F. Jezequel	[2] [5]
17	J. Jimenez	[5] [9]
18	Ph. Larre	[5]
19	Dean Lewis	[1] [3] [6] [8]
20	D. Marin-Cudraz	[9]
21	Tomonori Nakamura	[4]
22	J. Noel	[1]
23	Thierry Parrassin	[3] [6] [7]
24	Philippe Perdu	[1] [3] [4] [6] [8]
25	E. Petit	[2] [5]
26	A. Pigozzi	[1]
27	M. Remmach	[1]
28	Antoine Reverdy	[3] [6]
29	C. Richier	[2]
30	Michel Vallet	[2] [3] [5] [6] [7]
31	V. Varo	[5]

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