 | 2010 |
|---|
| 8 |       | David C. Keezer,
Carl Gray,
Dany Minier,
Patrice Ducharme:
Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic.
J. Electronic Testing 26(1): 87-96 (2010) |
| 2009 |
|---|
| 7 | | David C. Keezer,
Carl Gray,
A. M. Majid,
Dany Minier,
Patrice Ducharme:
A development platform and electronic modules for automated test up to 20 Gbps.
ITC 2009: 1-11 |
| 2008 |
|---|
| 6 | | David C. Keezer,
Dany Minier,
Patrice Ducharme:
Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications.
DATE 2008: 1486-1491 |
| 5 | | David C. Keezer,
Dany Minier,
Patrice Ducharme,
A. M. Majid:
An Electronic Module for 12.8 Gbps Multiplexing and Loopback Test.
ITC 2008: 1-9 |
| 4 | | David C. Keezer,
Dany Minier,
Patrice Ducharme,
Doris Viens,
Greg Flynn,
John McKillop:
MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing.
VLSI Design 2008: (2008) |
| 2007 |
|---|
| 3 | | David C. Keezer,
Dany Minier,
Patrice Ducharme:
Method for reducing jitter in multi-gigahertz ATE.
DATE 2007: 701-706 |
| 2 | | David C. Keezer,
Dany Minier,
Patrice Ducharme,
Doris Viens,
Greg Flynn,
John McKillop:
Multi-GHz loopback testing using MEMs switches and SiGe logic.
ITC 2007: 1-10 |
| 2006 |
|---|
| 1 | | David C. Keezer,
Dany Minier,
Patrice Ducharme:
Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses.
IEEE Design & Test of Computers 23(1): 46-57 (2006) |
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