 | 2009 |
|---|
| 5 |       | G. Haberfehlner,
Sergey Bychikhin,
V. Dubec,
Michael Heer,
A. Podgaynaya,
M. Pfost,
Matthias Stecher,
Erich Gornik,
Dionyz Pogany:
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system.
Microelectronics Reliability 49(9-11): 1346-1351 (2009) |
| 2007 |
|---|
| 4 | | V. Dubec,
Sergey Bychikhin,
Dionyz Pogany,
Erich Gornik,
Tilo Brodbeck,
Wolfgang Stadler:
Backside interferometric methods for localization of ESD-induced leakage current and metal shorts.
Microelectronics Reliability 47(9-11): 1539-1544 (2007) |
| 2006 |
|---|
| 3 | | Michael Heer,
V. Dubec,
Sergey Bychikhin,
Dionyz Pogany,
Erich Gornik,
M. Frank,
A. Konrad,
J. Schulz:
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up.
Microelectronics Reliability 46(9-11): 1591-1596 (2006) |
| 2005 |
|---|
| 2 | | Michael Heer,
V. Dubec,
M. Blaho,
Sergey Bychikhin,
Dionyz Pogany,
Erich Gornik,
M. Denison,
Matthias Stecher,
G. Groos:
Automated setup for thermal imaging and electrical degradation study of power DMOS devices.
Microelectronics Reliability 45(9-11): 1688-1693 (2005) |
| 2003 |
|---|
| 1 | | V. Dubec,
Sergey Bychikhin,
M. Blaho,
Dionyz Pogany,
Erich Gornik,
J. Willemen,
N. Qu,
Wolfgang Wilkening,
L. Zullino,
A. Andreini:
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress.
Microelectronics Reliability 43(9-11): 1557-1561 (2003) |
Data released under the ODC-BY 1.0 license — See also our legal information page