Xiaorong Duan

	2002
2		Fuchen Mu, Mingzhen Xu, Changhua Tan, Xiaorong Duan: Weibull characteristics of n-MOSFET's with ultrathin gate oxides under FN stress and lifetime prediction. Microelectronics Reliability 42(6): 985-989 (2002)
	2001
1		Fuchen Mu, Mingzhen Xu, Changhua Tan, Xiaorong Duan: A new lifetime prediction method for hot-carrier degradation in n-MOSFETs with ultrathin gate oxides under Vg=Vd. Microelectronics Reliability 41(11): 1909-1913 (2001)

Coauthor Index

1	Fuchen Mu	[1] [2]
2	Changhua Tan	[1] [2]
3	Mingzhen Xu	[1] [2]

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