F. Duan

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2003

2 F. Duan, R. Castagnetti, R. Venkatraman, O. Kobozeva, S. Ramesh: Design and Use of Memory-Specific Test Structures to Ensure SRAM Yield and Manufacturability. ISQED 2003: 119-124

2001

1 Helmut Puchner, Y.-C. Liu, W. Kong, F. Duan, R. Castagnetti: Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies. Microelectronics Reliability 41(9-10): 1319-1324 (2001)

	2003
2		F. Duan, R. Castagnetti, R. Venkatraman, O. Kobozeva, S. Ramesh: Design and Use of Memory-Specific Test Structures to Ensure SRAM Yield and Manufacturability. ISQED 2003: 119-124
	2001
1		Helmut Puchner, Y.-C. Liu, W. Kong, F. Duan, R. Castagnetti: Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies. Microelectronics Reliability 41(9-10): 1319-1324 (2001)

Coauthor Index

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team —

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1	R. Castagnetti	[1] [2]
2	O. Kobozeva	[2]
3	W. Kong	[1]
4	Y.-C. Liu	[1]
5	Helmut Puchner	[1]
6	S. Ramesh (Sethu Ramesh)	[2]
7	Ramakrishnan Venkatraman (R. Venkatraman)	[2]