 | 2011 |
| 11 |  | Dragoljub Gagi Drmanac,
Nik Sumikawa,
LeRoy Winemberg,
Li-C. Wang,
Magdy S. Abadir:
Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits.
DATE 2011: 794-799 |
| 10 |  | Nik Sumikawa,
Dragoljub Gagi Drmanac,
Li-C. Wang,
LeRoy Winemberg,
Magdy S. Abadir:
Forward prediction based on wafer sort data - A case study.
ITC 2011: 1-10 |
| 9 |  | Dragoljub Gagi Drmanac,
Michael Laisne:
Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study.
ITC 2011: 1-10 |
| 8 |  | Nik Sumikawa,
Dragoljub Gagi Drmanac,
Li-C. Wang,
LeRoy Winemberg,
Magdy S. Abadir:
Understanding customer returns from a test perspective.
VTS 2011: 2-7 |
| 2010 |
| 7 |  | Nicholas Callegari,
Dragoljub Gagi Drmanac,
Li-C. Wang,
Magdy S. Abadir:
Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch.
DAC 2010: 374-379 |
| 6 |  | Po-Hsien Chang,
Dragoljub Gagi Drmanac,
Li-C. Wang:
Online selection of effective functional test programs based on novelty detection.
ICCAD 2010: 762-769 |
| 5 |  | Dragoljub Gagi Drmanac,
Brendon Bolin,
Li-C. Wang:
A non-parametric approach to behavioral device modeling.
ISQED 2010: 284-290 |
| 4 |  | Janine Chen,
Brendon Bolin,
Li-C. Wang,
Jing Zeng,
Dragoljub Gagi Drmanac,
Michael Mateja:
Mining AC delay measurements for understanding speed-limiting paths.
ITC 2010: 553-562 |
| 2009 |
| 3 |  | Dragoljub Gagi Drmanac,
Frank Liu,
Li-C. Wang:
Predicting variability in nanoscale lithography processes.
DAC 2009: 545-550 |
| 2 |  | Dragoljub Gagi Drmanac,
Brendon Bolin,
Li-C. Wang,
Magdy S. Abadir:
Minimizing outlier delay test cost in the presence of systematic variability.
ITC 2009: 1-10 |
| 2008 |
| 1 |  | Sean H. Wu,
Dragoljub Gagi Drmanac,
Li-C. Wang:
A Study of Outlier Analysis Techniques for Delay Testing.
ITC 2008: 1-10 |