 | 2002 |
|---|
| 6 |       | John E. Barth Jr.,
Jeffrey Dreibelbis,
Eric A. Nelson,
Darren Anand,
Gary Pomichter,
Peter Jakobsen,
Michael R. Nelms,
Jeffrey Leach,
George M. Belansek:
Embedded DRAM design and architecture for the IBM 0.11-µm ASIC offering.
IBM Journal of Research and Development 46(6): 675-690 (2002) |
| 2001 |
|---|
| 5 | | Roderick McConnell,
Rochit Rajsuman,
Eric A. Nelson,
Jeffrey Dreibelbis:
Test and repair of large embedded DRAMs. I.
ITC 2001: 163-172 |
| 4 | | Eric A. Nelson,
Jeffrey Dreibelbis,
Roderick McConnell:
Test and repair of large embedded DRAMs. 2.
ITC 2001: 173-181 |
| 3 | | Peter Jakobsen,
Jeffrey Dreibelbis,
Gary Pomichter,
Darren Anand,
John E. Barth Jr.,
Michael R. Nelms,
Jeffrey Leach,
George M. Belansek:
Embedded DRAM built in self test and methodology for test insertion.
ITC 2001: 975-984 |
| 2 | | Brian R. Kessler,
Jeffrey Dreibelbis,
Tim McMahon,
Joshua S. McCloy,
Rex Kho:
BIST-Based Bitfail Mapping of an Embedded DRAM.
MTDT 2001: 29- |
| 1995 |
|---|
| 1 |  | Wayne F. Ellis,
John E. Barth Jr.,
Sri Divakaruni,
Jeffrey Dreibelbis,
Anatol Furman,
Erik L. Hedberg,
Hsing-San Lee,
Thomas M. Maffitt,
Christopher P. Miller,
Charles H. Stapper,
Howard L. Kalter:
Multipurpose DRAM architecture for optimal power, performance, and product flexibility.
IBM Journal of Research and Development 39(1-2): 51-62 (1995) |
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