 | 2012 |
|---|
| 10 |       | Rainer Dorsch,
Richard K. Errickson,
Markus M. Helms,
G. Crew,
Thomas A. Gregg,
Welela Haileselassie,
L. W. Helmer,
A. Kohler,
Kulwant M. Pandey,
Susanne Roscher,
E. S. Rotter,
Christian Haubelt:
IBM Parallel Sysplex design for the IBM z196 system.
IBM Journal of Research and Development 56(1): 9 (2012) |
| 2010 |
|---|
| 9 | | Christian Zebelein,
Joachim Falk,
Christian Haubelt,
Jürgen Teich,
Rainer Dorsch:
Efficient High-Level modeling in the networking domain.
DATE 2010: 1189-1194 |
| 2009 |
|---|
| 8 | | Thomas Schlipf,
Markus M. Helms,
J. Ruf,
M. Klein,
Rainer Dorsch,
B. Hoppe,
Walter Lipponer,
S. Boekholt,
T. Rower,
Manfred H. Walz,
S. Junghans:
Design and verification of the IBM System z10 I/O subsystem chips.
IBM Journal of Research and Development 53(1): 7 (2009) |
| 2006 |
|---|
| 7 | | Martin Streubühr,
Joachim Falk,
Christian Haubelt,
Jürgen Teich,
Rainer Dorsch,
Thomas Schlipf:
Task-accurate performance modeling in SystemC for real-time multi-processor architectures.
DATE 2006: 480-481 |
| 2005 |
|---|
| 6 | | Pattara Kiatisevi,
Luis Leonardo Azuara-Gomez,
Rainer Dorsch,
Hans-Joachim Wunderlich:
Development of an audio player as system-on-a-chip using an open source platform.
ISCAS (3) 2005: 2935-2938 |
| 2002 |
|---|
| 5 | | Rainer Dorsch,
Ramón Huerta Rivera,
Hans-Joachim Wunderlich,
Martin Fischer:
Adapting an SoC to ATE Concurrent Test Capabilities.
ITC 2002: 1169-1175 |
| 4 | | Rainer Dorsch,
Hans-Joachim Wunderlich:
Reusing Scan Chains for Test Pattern Decompression.
J. Electronic Testing 18(2): 231-240 (2002) |
| 2001 |
|---|
| 3 | | Rainer Dorsch,
Hans-Joachim Wunderlich:
Using mission logic for embedded testing.
DATE 2001: 805 |
| 2 | | Rainer Dorsch,
Hans-Joachim Wunderlich:
Tailoring ATPG for embedded testing.
ITC 2001: 530-537 |
| 1998 |
|---|
| 1 | | Rainer Dorsch,
Hans-Joachim Wunderlich:
Accumulator based deterministic BIST.
ITC 1998: 412-421 |
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