Tom Donnelly

	2000
1		Valery Axelrad, Nicolas B. Cobb, M. O'Brien, Thuy Do, Tom Donnelly, Yuri Granik, Emile Y. Sahouria, Victor Boksha, Artur Balasinski: Efficient Full-Chip Yield Analysis Methodology for OPC-Corrected VLSI Designs. ISQED 2000: 461-466

Coauthor Index

1	Valery Axelrad	[1]
2	Artur Balasinski	[1]
3	Victor Boksha	[1]
4	Nicolas B. Cobb	[1]
5	Thuy Do	[1]
6	Yuri Granik	[1]
7	M. O'Brien	[1]
8	Emile Y. Sahouria	[1]

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