B. Domengès

	2011
4		T. Delaroque, B. Domengès, A. Colder, K. Danilo: Comprehensive nanostructural study of SSRM nanocontact on silicon. Microelectronics Reliability 51(9-11): 1693-1696 (2011)
	2005
3		D. Abessolo-Bidzo, P. Poirier, Ph. Descamps, B. Domengès: Isolating failing sites in IC packages using time domain reflectometry: Case studies. Microelectronics Reliability 45(9-11): 1639-1644 (2005)
	2002
2		B. Domengès, P. Schwindenhammer, P. Poirier, Felix Beaudoin, Ph. Descamps: Comprehensive failure analysis of leakage faults in bipolar transistors. Microelectronics Reliability 42(9-11): 1449-1452 (2002)
1		O. Crépel, C. Goupil, B. Domengès, Ph. Descamps, Philippe Perdu, A. Doukkali: Magnetic field measurements for Non Destructive Failure Analysis. Microelectronics Reliability 42(9-11): 1763-1766 (2002)

Coauthor Index

1	D. Abessolo-Bidzo	[3]
2	Felix Beaudoin	[2]
3	A. Colder	[4]
4	O. Crépel	[1]
5	K. Danilo	[4]
6	T. Delaroque	[4]
7	Ph. Descamps	[1] [2] [3]
8	A. Doukkali	[1]
9	C. Goupil	[1]
10	Philippe Perdu	[1]
11	P. Poirier	[2] [3]
12	P. Schwindenhammer	[2]

Colors in the list of coauthors

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page