Krzysztof Domanski

	2009
4		Michael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler: Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology. Microelectronics Reliability 49(12): 1455-1464 (2009)
	2007
3		Ulrich Glaser, Kai Esmark, Martin Streibl, Christian Russ, Krzysztof Domanski, Mauro Ciappa, Wolfgang Fichtner: SCR operation mode of diode strings for ESD protection. Microelectronics Reliability 47(7): 1044-1053 (2007)
	2006
2		Krzysztof Domanski, B. Póltorak, S. Bargstädt-Franke, Wolfgang Stadler, W. Bala: Physical fundamentals of external transient latch-up and corrective actions. Microelectronics Reliability 46(5-6): 689-701 (2006)
	2005
1		S. Bargstädt-Franke, Wolfgang Stadler, Kai Esmark, Martin Streibl, Krzysztof Domanski, Horst A. Gieser, Heinrich Wolf, W. Bala: Transient latch-up: experimental analysis and device simulation. Microelectronics Reliability 45(2): 297-304 (2005)

Coauthor Index

1	W. Bala	[1] [2]
2	S. Bargstädt-Franke	[1] [2]
3	Mauro Ciappa	[3]
4	Kai Esmark	[1] [3] [4]
5	Wolfgang Fichtner	[3]
6	Horst A. Gieser	[1]
7	Ulrich Glaser	[3] [4]
8	Erich Gornik	[4]
9	Michael Heer	[4]
10	Dionyz Pogany	[4]
11	B. Póltorak	[2]
12	Christian Russ	[3]
13	Wolfgang Stadler	[1] [2] [4]
14	Martin Streibl	[1] [3]
15	Heinrich Wolf	[1]

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