Seungyong Doh

	2012
3		Dongil Kim, Pilsung Kang, Sungzoon Cho, Hyoungjoo Lee, Seungyong Doh: Machine learning-based novelty detection for faulty wafer detection in semiconductor manufacturing. Expert Syst. Appl. 39(4): 4075-4083 (2012)
	2011
2		Pilsung Kang, Dongil Kim, Hyoungjoo Lee, Seungyong Doh, Sungzoon Cho: Virtual metrology for run-to-run control in semiconductor manufacturing. Expert Syst. Appl. 38(3): 2508-2522 (2011)
	2009
1		Pilsung Kang, Hyoungjoo Lee, Sungzoon Cho, Dongil Kim, Jinwoo Park, Chan-Kyoo Park, Seungyong Doh: A virtual metrology system for semiconductor manufacturing. Expert Syst. Appl. 36(10): 12554-12561 (2009)

Coauthor Index

1	Sungzoon Cho	[1] [2] [3]
2	Pilsung Kang	[1] [2] [3]
3	Dongil Kim	[1] [2] [3]
4	Hyoungjoo Lee	[1] [2] [3]
5	Chan-Kyoo Park	[1]
6	Jinwoo Park	[1]

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