 | 2008 |
| 4 |  | Jason Doege,
Alfred L. Crouch:
The Advantages of Limiting P1687 to a Restricted Subset.
ITC 2008: 1-8 |
| 2006 |
| 3 |  | Ken Posse,
Al Crouch,
Jeff Rearick,
Bill Eklow,
Mike Laisne,
Ben Bennetts,
Jason Doege,
Mike Ricchetti,
J.-F. Cote:
IEEE P1687: Toward Standardized Access of Embedded Instrumentation.
ITC 2006: 1-8 |
| 2003 |
| 2 |  | Alfred L. Crouch,
John C. Potter,
Jason Doege:
AC Scan Path Selection for Physical Debugging.
IEEE Design & Test of Computers 20(5): 34-40 (2003) |
| 1995 |
| 1 |  | Douglas Reed,
Jason Doege,
Antonio Rubio:
Improving Board and System Test: A Proposal to Integrate Boundary Scan and IDDQ.
ITC 1995: 577-585 |