Michael J. Dion

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2001

1 Michael J. Dion: Improved understanding of metal ion reservoirs within barrier-metal systems. Microelectronics Reliability 41(6): 805-814 (2001)

	2001
1		Michael J. Dion: Improved understanding of metal ion reservoirs within barrier-metal systems. Microelectronics Reliability 41(6): 805-814 (2001)

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