S. Dimitrijev

	2005
4		Ninoslav Stojadinovic, I. Manic, V. Davidovic, D. Dankovic, S. Djoric-Veljkovic, S. Golubovic, S. Dimitrijev: Effects of electrical stressing in power VDMOSFETs. Microelectronics Reliability 45(1): 115-122 (2005)
	2002
3		Ninoslav Stojadinovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, S. Dimitrijev: Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs. Microelectronics Reliability 42(4-5): 669-677 (2002)
2		Ninoslav Stojadinovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, D. Dankovic, S. Golubovic, S. Dimitrijev: Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs. Microelectronics Reliability 42(9-11): 1465-1468 (2002)
	2001
1		Ninoslav Stojadinovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, S. Dimitrijev: Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs. Microelectronics Reliability 41(9-10): 1373-1378 (2001)

Coauthor Index

1	D. Dankovic	[2] [4]
2	V. Davidovic	[1] [2] [3] [4]
3	S. Djoric-Veljkovic	[1] [2] [3] [4]
4	S. Golubovic	[1] [2] [3] [4]
5	I. Manic	[1] [2] [3] [4]
6	Ninoslav Stojadinovic	[1] [2] [3] [4]

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