Luigi Dilillo

	2012
44		J. Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay: Impact of resistive-open defects on the heat current of TAS-MRAM architectures. DATE 2012: 532-537
43		Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez: Analysis and Fault Modeling of Actual Resistive Defects in ATMEL [InlineMediaObject not available: see fulltext.] eFlash Memories. J. Electronic Testing 28(2): 215-228 (2012)
	2011
42		D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Hans-Joachim Wunderlich: A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits. Asian Test Symposium 2011: 136-141
41		Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine: Failure Analysis and Test Solutions for Low-Power SRAMs. Asian Test Symposium 2011: 459-460
40		Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, X. Wen: Power-Aware Test Pattern Generation for At-Speed LOS Testing. Asian Test Symposium 2011: 506-510
39		Kohei Miyase, Y. Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Virazel: Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling. Asian Test Symposium 2011: 90-95
38		Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: A study of path delay variations in the presence of uncorrelated power and ground supply noise. DDECS 2011: 189-194
37		Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling. DDECS 2011: 353-358
36		Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez: On using a SPICE-like TSTAC™ eFlash model for design and test. DDECS 2011: 359-364
35		Luigi Dilillo, Alberto Bosio, Miroslav Valka, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: Error Resilient Infrastructure for Data Transfer in a Distributed Neutron Detector. DFT 2011: 294-301
34		Miroslav Valka, Alberto Bosio, Luigi Dilillo, Pierre Girard, Serge Pravossoudovitch, Arnaud Virazel, Ernesto Sánchez, Mauricio de Carvalho, Matteo Sonza Reorda: A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing. European Test Symposium 2011: 153-158
33		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: On using address scrambling to implement defect tolerance in SRAMs. ITC 2011: 1-8
	2010
32		Paolo Rech, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Luigi Dilillo: A Memory Fault Simulator for Radiation-Induced Effects in SRAMs. Asian Test Symposium 2010: 100-105
31		Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Olivia Riewer: A Comprehensive System-on-Chip Logic Diagnosis. Asian Test Symposium 2010: 237-242
30		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: A statistical simulation method for reliability analysis of SRAM core-cells. DAC 2010: 853-856
29		Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Junxia Ma, Wei Zhao, Mohammad Tehranipoor, Xiaoqing Wen: Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes. DDECS 2010: 376-381
28		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: Impact of Resistive-Bridging Defects in SRAM Core-Cell. DELTA 2010: 265-269
27		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes. European Test Symposium 2010: 132-137
26		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: Setting test conditions for improving SRAM reliability. European Test Symposium 2010: 257
25		Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez: A two-layer SPICE model of the ATMEL TSTACTM eFlash memory technology for defect injection and faulty behavior prediction. European Test Symposium 2010: 81-86
24		Paolo Rech, Michelangelo Grosso, Fabio Melchiori, D. Loparco, Davide Appello, Luigi Dilillo, Alessandro Paccagnella, Matteo Sonza Reorda: Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. IOLTS 2010: 29-34
23		Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed: Is test power reduction through X-filling good enough? ITC 2010: 805
22		Jean Marc Gallière, Paolo Rech, Patrick Girard, Luigi Dilillo: A roaming memory test bench for detecting particle induced SEUs. ITC 2010: 810
21		D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Hans-Joachim Wunderlich: Parity prediction synthesis for nano-electronic gate designs. ITC 2010: 820
20		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Pierre Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: Detecting NBTI induced failures in SRAM core-cells. VTS 2010: 75-80
19		Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Xiaoqing Wen, Nisar Ahmed: A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for Launch-Off-Shift and Launch-Off-Capture Schemes. J. Low Power Electronics 6(2): 359-374 (2010)
	2009
18		Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Olivia Riewer: Delay Fault Diagnosis in Sequential Circuits. Asian Test Symposium 2009: 355-360
17		Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin: A new design-for-test technique for SRAM core-cell stability faults. DATE 2009: 1344-1348
16		Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Laroussi Bouzaida, Isabelle Izaute: Comprehensive bridging fault diagnosis based on the SLAT paradigm. DDECS 2009: 264-269
15		Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard: NAND flash testing: A preliminary study on actual defects. ITC 2009: 1
	2008
14		Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. ITC 2008: 1-10
	2007
13		Luigi Dilillo, Bashir M. Al-Hashimi: March CRF: an Efficient Test for Complex Read Faults in SRAM Memories. DDECS 2007: 173-178
12		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. J. Electronic Testing 23(5): 435-444 (2007)
	2006
11		Luigi Dilillo, Paul M. Rosinger, Bashir M. Al-Hashimi, Patrick Girard: Minimizing test power in SRAM through reduction of pre-charge activity. DATE 2006: 1159-1164
10		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS 2006: 256-261
9		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. J. Electronic Testing 22(3): 287-296 (2006)
8		Luigi Dilillo, Paul M. Rosinger, Bashir M. Al-Hashimi, Patrick Girard: Reducing Power Dissipation in SRAM during Test. J. Low Power Electronics 2(2): 271-280 (2006)
	2005
7		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. DAC 2005: 857-862
6		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan: Data Retention Fault in SRAM Memories: Analysis and Detection Procedures. VTS 2005: 183-188
5		Simone Borri, Magali Bastian Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. J. Electronic Testing 21(2): 169-179 (2005)
4		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. J. Electronic Testing 21(5): 551-561 (2005)
	2004
3		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. Asian Test Symposium 2004: 266-271
2		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri: March iC-: An Improved Version of March C- for ADOFs Detection. VTS 2004: 129-138
	2003
1		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri: Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders. Asian Test Symposium 2003: 250-255

Coauthor Index

1	Nisar Ahmed	[19] [23]
2	Bashir M. Al-Hashimi	[8] [11] [13]
3	Jérémy Alvarez-Herault	[44]
4	Davide Appello	[24]
5	J. Azevedo	[44]
6	Nabil Badereddine	[20] [26] [27] [28] [30] [33] [37] [41]
7	Magali Bastian (Magali Bastian Hage-Hassan)	[3] [4] [5] [6] [7] [9] [10] [12] [14] [17]
8	Youssef Benabboud	[16] [18] [31]
9	Simone Borri	[1] [2] [3] [4] [5] [9]
10	Alberto Bosio	[14] [15] [16] [18] [19] [20] [21] [23] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [37] [38] [39] [40] [41] [42] [43] [44]
11	Laroussi Bouzaida	[16]
12	Mauricio de Carvalho	[34]
13	Kazunari Enokimoto	[39]
14	Gilles Festes	[25] [36] [43]
15	Renan Alves Fonseca	[20] [26] [27] [28] [30] [33]
16	Jean Marc Gallière	[22]
17	Patrick Girard	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [14] [15] [16] [17] [18] [19] [21] [22] [23] [25] [26] [27] [28] [29] [30] [31] [32] [33] [35] [36] [37] [38] [39] [40] [41] [42] [43] [44]
18	Pierre Girard	[20] [34]
19	Benoît Godard	[15] [25] [36] [43]
20	Vincent Gouin	[17]
21	Michelangelo Grosso	[24]
22	Isabelle Izaute	[16]
23	Seiji Kajihara	[39]
24	D. Loparco	[24]
25	Junxia Ma	[29]
26	Ken Mackay	[44]
27	Pierre-Didier Mauroux	[15] [25] [36] [43]
28	Fabio Melchiori	[24]
29	Kohei Miyase	[23] [39] [40]
30	Alexandre Ney	[14] [17]
31	Alessandro Paccagnella	[24]
32	Serge Pravossoudovitch	[1] [2] [3] [4] [5] [6] [7] [9] [10] [12] [14] [15] [16] [17] [18] [19] [20] [21] [23] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [37] [38] [41] [42] [43]
33	G. Prenat	[44]
34	Paolo Rech	[22] [24] [32]
35	Matteo Sonza Reorda	[24] [34]
36	Olivia Riewer	[18] [31]
37	Paul M. Rosinger	[8] [11]
38	Ernesto Sánchez (Edgar E. Sánchez, Edgar Ernesto Sánchez Sánchez)	[34]
39	Mohammad Tehranipoor	[19] [23] [29]
40	Aida Todri (Aida Todri-Sanial)	[38] [40] [41] [44]
41	D. A. Tran	[21] [42]
42	Y. Uchinodan	[39]
43	Laurent Vachez	[25] [36] [43]
44	Miroslav Valka	[34] [35]
45	Arnaud Virazel	[1] [2] [3] [4] [5] [6] [7] [9] [10] [12] [14] [15] [16] [17] [18] [19] [20] [21] [23] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [37] [38] [39] [40] [41] [42] [43] [44]
46	X. Wen	[40]
47	Xiaoqing Wen	[19] [23] [29] [39]
48	Fangmei Wu	[19] [23] [29] [39]
49	Hans-Joachim Wunderlich	[21] [42]
50	Yuta Yamato	[39]
51	Wei Zhao	[29]
52	Leonardo Bonet Zordan	[37] [41]

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page