B. Dietrich

	2001
1		Kai F. Dombrowski, B. Dietrich, Ingrid De Wolf, R. Rooyackers, G. Badenes: Investigation of stress in shallow trench isolation using UV micro-Raman spectroscopy. Microelectronics Reliability 41(4): 511-515 (2001)

Coauthor Index

1	G. Badenes	[1]
2	Kai F. Dombrowski	[1]
3	R. Rooyackers	[1]
4	Ingrid De Wolf	[1]

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