Gunnar Diestel

	2001
1		Gunnar Diestel, Andreas Martin, Martin Kerber, Alfred Schlemm, Horst Erlenmaier, Bernhard Murr, Andreas Preussger: Quality assessment of thin oxides using constant and ramped stress measurements. Microelectronics Reliability 41(7): 1019-1022 (2001)

Coauthor Index

1	Horst Erlenmaier	[1]
2	Martin Kerber	[1]
3	Andreas Martin	[1]
4	Bernhard Murr	[1]
5	Andreas Preussger	[1]
6	Alfred Schlemm	[1]

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