T. Diep

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2001

1 L. G. Henry, M. A. Kelly, T. Diep, J. Barth: Issues concerning charged device model ESD verification modules - the need to move to alumina. Microelectronics Reliability 41(3): 407-415 (2001)

	2001
1		L. G. Henry, M. A. Kelly, T. Diep, J. Barth: Issues concerning charged device model ESD verification modules - the need to move to alumina. Microelectronics Reliability 41(3): 407-415 (2001)

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