J. M. Dienot

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2005

1 Etienne Sicard, J. M. Dienot: Issues in electromagnetic compatibility of integrated circuits: emission and susceptibility. Microelectronics Reliability 45(9-11): 1277-1284 (2005)

	2005
1		Etienne Sicard, J. M. Dienot: Issues in electromagnetic compatibility of integrated circuits: emission and susceptibility. Microelectronics Reliability 45(9-11): 1277-1284 (2005)

Coauthor Index

1 Etienne Sicard [1]

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