Percy G. Dias

	1997
1		Shiyi Xu, Peter Waignjo, Percy G. Dias, Bole Shi: Testability Prediction for Sequential Circuits Using Neural Network. Asian Test Symposium 1997: 48-

Coauthor Index

1	Baile Shi (Bole Shi)	[1]
2	Peter Waignjo	[1]
3	Shiyi Xu	[1]

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