L. Dias

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1996

1 F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos, João Paulo Teixeira: Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. ITC 1996: 620-628

	1996
1		F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos, João Paulo Teixeira: Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. ITC 1996: 620-628

Coauthor Index

Last update Tue May 29 01:28:40 2012 CET by the DBLP Team —

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1	F. Celeiro	[1]
2	J. Ferreira	[1]
3	Marcelino B. Santos (Marcelino Bicho Dos Santos)	[1]
4	João Paulo Teixeira	[1]