W. Deweerd

	2007
3		Z. Li, T. Schram, L. Pantisano, A. Stesmans, Thierry Conard, S. Shamuilia, V. V. Afanasiev, A. Akheyar, Sven Van Elshocht, D. P. Brunco, W. Deweerd, Y. Naoki, P. Lehnen, Stefan De Gendt, K. De Meyer: Mechanism of O2-anneal induced Vfb shifts of Ru gated stacks. Microelectronics Reliability 47(4-5): 518-520 (2007)
	2005
2		T. Schram, L.-Å. Ragnarsson, G. Lujan, W. Deweerd, J. Chen, W. Tsai, K. Henson, R. J. P. Lander, J. C. Hooker, J. Vertommen: Performance improvement of self-aligned HfO2/TaN and SiON/TaN nMOS transistors. Microelectronics Reliability 45(5-6): 779-782 (2005)
1		W. Deweerd, Vidya Kaushik, J. Chen, Y. Shimamoto, T. Schram, L.-Å. Ragnarsson, Annelies Delabie, L. Pantisano, B. Eyckens, J. W. Maes: Potential remedies for the VT/Vfb-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey. Microelectronics Reliability 45(5-6): 786-789 (2005)

Coauthor Index

1	V. V. Afanasiev	[3]
2	A. Akheyar	[3]
3	D. P. Brunco	[3]
4	J. Chen	[1] [2]
5	Thierry Conard	[3]
6	Annelies Delabie	[1]
7	Sven Van Elshocht	[3]
8	B. Eyckens	[1]
9	Stefan De Gendt	[3]
10	K. Henson	[2]
11	J. C. Hooker	[2]
12	Vidya Kaushik	[1]
13	R. J. P. Lander	[2]
14	P. Lehnen	[3]
15	Z. Li	[3]
16	G. Lujan	[2]
17	J. W. Maes	[1]
18	K. De Meyer	[3]
19	Y. Naoki	[3]
20	L. Pantisano	[1] [3]
21	L.-Å. Ragnarsson	[1] [2]
22	T. Schram	[1] [2] [3]
23	S. Shamuilia	[3]
24	Y. Shimamoto	[1]
25	A. Stesmans	[3]
26	W. Tsai	[2]
27	J. Vertommen	[2]

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