Narendra Devta-Prasanna

	2010
20		Narendra Devta-Prasanna, Arun Gunda, Sudhakar M. Reddy, Irith Pomeranz: Multiple fault activation cycle tests for transistor stuck-open faults. ITC 2010: 821
19		Narendra Devta-Prasanna, Arun Gunda: Clock Gate Test Points. ITC 2010: 84-93
	2009
18		Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz: Detectability of internal bridging faults in scan chains. ASP-DAC 2009: 678-683
17		Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz: Improving the Detectability of Resistive Open Faults in Scan Cells. DFT 2009: 383-391
16		Narendra Devta-Prasanna, Sandeep Kumar Goel, Arun Gunda, Mark Ward, P. Krishnamurthy: Accurate measurement of small delay defect coverage of test patterns. ITC 2009: 1-10
15		Sandeep Kumar Goel, Narendra Devta-Prasanna, Mark Ward: Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study. ITC 2009: 1-10
14		Sandeep Kumar Goel, Narendra Devta-Prasanna, Ritesh P. Turakhia: Effective and Efficient Test Pattern Generation for Small Delay Defect. VTS 2009: 111-116
	2008
13		Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz: Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells. DFT 2008: 394-402
12		Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz: An Enhanced Logic BIST Architecture for Online Testing. IOLTS 2008: 10-15
11		Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz: Detection of Internal Stuck-open Faults in Scan Chains. ITC 2008: 1-10
10		Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz: On the Detectability of Scan Chain Internal Faults — An Industrial Case Study. VTS 2008: 79-84
9		Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda: Comparative study of centralised and distributed compatibility-based test data compression. IET Computers & Digital Techniques 2(2): 108-117 (2008)
	2007
8		Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda: Systematic Scan Reconfiguration. ASP-DAC 2007: 738-743
7		Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda: Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. IEEE Trans. on CAD of Integrated Circuits and Systems 26(5): 907-918 (2007)
	2006
6		Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz: Test Generation for Open Defects in CMOS Circuits. DFT 2006: 41-49
5		Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz: A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults. European Test Symposium 2006: 185-192
	2005
4		Narendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz: Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions. Asian Test Symposium 2005: 202-207
3		Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda: Should Illinois-Scan Based Architectures be Centralized or Distributed? DFT 2005: 406-414
2		Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz: A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals. ICCD 2005: 471-474
1		Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz: Methods for improving transition delay fault coverage using broadside tests. ITC 2005: 10

Coauthor Index

1	Ahmad A. Al-Yamani	[3] [7] [8] [9]
2	Sreejit Chakravarty	[10] [11] [12] [13] [17] [18]
3	Erik Chmelar	[7]
4	Sandeep Kumar Goel	[14] [15] [16]
5	M. Grinchuk	[7]
6	Arun Gunda	[1] [2] [3] [4] [5] [6] [7] [8] [9] [16] [19] [20]
7	P. Krishnamurthy	[1] [2] [4] [5] [6] [16]
8	Irith Pomeranz	[1] [2] [4] [5] [6] [10] [11] [12] [13] [17] [18] [20]
9	Sudhakar M. Reddy	[1] [2] [4] [5] [6] [10] [11] [12] [13] [17] [18] [20]
10	Ritesh P. Turakhia	[14]
11	Mark Ward	[15] [16]
12	Fan Yang	[10] [11] [12] [13] [17] [18]

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