 | 2010 |
|---|
| 9 |       | Rao Desineni,
Leah Pastel,
Maroun Kassab,
Robert Redburn:
Hard to find, easy to find systematics; just find them.
ITC 2010: 388-397 |
| 2006 |
|---|
| 8 | | Jeffrey E. Nelson,
Jason G. Brown,
Rao Desineni,
R. D. (Shawn) Blanton:
Multiple-detect ATPG based on physical neighborhoods.
DAC 2006: 1099-1102 |
| 7 | | Jeffrey E. Nelson,
Thomas Zanon,
Rao Desineni,
Jason G. Brown,
N. Patil,
Wojciech Maly,
R. D. (Shawn) Blanton:
Extraction of defect density and size distributions from wafer sort test results.
DATE 2006: 913-918 |
| 6 | | Rao Desineni,
Osei Poku,
Ronald D. Blanton:
A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior.
ITC 2006: 1-10 |
| 5 | | Ronald D. Blanton,
Kumar N. Dwarakanath,
Rao Desineni:
Defect Modeling Using Fault Tuples.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2450-2464 (2006) |
| 2005 |
|---|
| 4 | | Rao Desineni,
R. D. (Shawn) Blanton:
Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction.
VTS 2005: 366-373 |
| 2004 |
|---|
| 3 | | Thomas J. Vogels,
Thomas Zanon,
Rao Desineni,
R. D. (Shawn) Blanton,
Wojciech Maly,
Jason G. Brown,
Jeffrey E. Nelson,
Y. Fei,
X. Huang,
Padmini Gopalakrishnan,
Mahim Mishra,
Vyacheslav Rovner,
S. Tiwary:
Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations.
ITC 2004: 508-517 |
| 2002 |
|---|
| 2 | | Ronald D. Blanton,
John T. Chen,
Rao Desineni,
Kumar N. Dwarakanath,
Wojciech Maly,
Thomas J. Vogels:
Fault Tuples in Diagnosis of Deep-Submicron Circuits.
ITC 2002: 233-241 |
| 2000 |
|---|
| 1 | | Rao Desineni,
Kumar N. Dwarakanath,
Ronald D. Blanton:
Universal test generation using fault tuples.
ITC 2000: 812-819 |
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