 | 2010 |
|---|
| 7 |       | R. Baillot,
Y. Deshayes,
L. Béchou,
T. Buffeteau,
I. Pianet,
C. Armand,
F. Voillot,
S. Sorieul,
Y. Ousten:
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses.
Microelectronics Reliability 50(9-11): 1568-1573 (2010) |
| 2008 |
|---|
| 6 | | M. L. Bourqui,
L. Béchou,
Olivier Gilard,
Y. Deshayes,
P. Del Vecchio,
L. S. How,
F. Rosala,
Y. Ousten,
André Touboul:
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications.
Microelectronics Reliability 48(8-9): 1202-1207 (2008) |
| 5 | | Y. Deshayes,
I. Bord,
G. Barreau,
M. Aiche,
P. H. Moretto,
L. Béchou,
A. C. Roehrig,
Y. Ousten:
Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation.
Microelectronics Reliability 48(8-9): 1354-1360 (2008) |
| 2005 |
|---|
| 4 | | S. Huyghe,
L. Béchou,
N. Zerounian,
Y. Deshayes,
F. Aniel,
A. Denolle,
D. Laffitte,
J. L. Goudard,
Y. Danto:
Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier.
Microelectronics Reliability 45(9-11): 1593-1599 (2005) |
| 2003 |
|---|
| 3 | | Y. Deshayes,
L. Béchou,
J.-Y. Delétage,
F. Verdier,
Y. Danto,
D. Laffitte,
J. L. Goudard:
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules.
Microelectronics Reliability 43(7): 1125-1136 (2003) |
| 2 | | J.-Y. Delétage,
F. J.-M. Verdier,
B. Plano,
Y. Deshayes,
L. Béchou,
Y. Danto:
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations.
Microelectronics Reliability 43(7): 1137-1144 (2003) |
| 1 | | L. Mendizabal,
Jean-Louis Verneuil,
L. Béchou,
Christelle Aupetit-Berthelemot,
Y. Deshayes,
F. Verdier,
Jean-Michel Dumas,
Y. Danto,
D. Laffitte,
J. L. Goudard:
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator.
Microelectronics Reliability 43(9-11): 1743-1749 (2003) |
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