Ph. Descamps

	2008
5		P. Schwindenhammer, H. Murray, Ph. Descamps, P. Poirier: Determination of temperature change inside IC packages during laser ablation of molding compound. Microelectronics Reliability 48(8-9): 1263-1267 (2008)
	2005
4		D. Abessolo-Bidzo, P. Poirier, Ph. Descamps, B. Domengès: Isolating failing sites in IC packages using time domain reflectometry: Case studies. Microelectronics Reliability 45(9-11): 1639-1644 (2005)
	2003
3		O. Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Ph. Descamps, Felix Beaudoin, L. Marina: Magnetic emission mapping for passive integrated components characterisation. Microelectronics Reliability 43(9-11): 1809-1814 (2003)
	2002
2		B. Domengès, P. Schwindenhammer, P. Poirier, Felix Beaudoin, Ph. Descamps: Comprehensive failure analysis of leakage faults in bipolar transistors. Microelectronics Reliability 42(9-11): 1449-1452 (2002)
1		O. Crépel, C. Goupil, B. Domengès, Ph. Descamps, Philippe Perdu, A. Doukkali: Magnetic field measurements for Non Destructive Failure Analysis. Microelectronics Reliability 42(9-11): 1763-1766 (2002)

Coauthor Index

1	D. Abessolo-Bidzo	[4]
2	Felix Beaudoin	[2] [3]
3	Y. Bouttement	[3]
4	O. Crépel	[1] [3]
5	Romain Desplats	[3]
6	B. Domengès	[1] [2] [4]
7	A. Doukkali	[1]
8	C. Goupil	[1] [3]
9	L. Marina	[3]
10	H. Murray	[5]
11	Philippe Perdu	[1] [3]
12	P. Poirier	[2] [4] [5]
13	P. Schwindenhammer	[2] [5]

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