 | 2011 |
| 9 |  | Chin-Fu Li,
Chi-Ying Lee,
Chen-Hsing Wang,
Shu-Lin Chang,
Li-Ming Denq,
Chun-Chuan Chi,
Hsuan-Jung Hsu,
Ming-Yi Chu,
Jing-Jia Liou,
Shi-Yu Huang,
Po-Chiun Huang,
Hsi-Pin Ma,
Jenn-Chiou Bor,
Cheng-Wen Wu,
Ching-Cheng Tien,
Chi-Hu Wang,
Yung-Sheng Kuo,
Chih-Tsun Huang,
Tien-Yu Chang:
A low-cost wireless interface with no external antenna and crystal oscillator for cm-range contactless testing.
DAC 2011: 771-776 |
| 8 |  | Mincent Lee,
Li-Ming Denq,
Cheng-Wen Wu:
A Memory Built-In Self-Repair Scheme Based on Configurable Spares.
IEEE Trans. on CAD of Integrated Circuits and Systems 30(6): 919-929 (2011) |
| 2010 |
| 7 |  | Yu-Tsao Hsing,
Li-Ming Denq,
Chao-Hsun Chen,
Cheng-Wen Wu:
Economic Analysis of the HOY Wireless Test Methodology.
IEEE Design & Test of Computers 27(3): 20-30 (2010) |
| 6 |  | Chih-Yen Lo,
Yu-Tsao Hsing,
Li-Ming Denq,
Cheng-Wen Wu:
SOC Test Architecture and Method for 3-D ICs.
IEEE Trans. on CAD of Integrated Circuits and Systems 29(10): 1645-1649 (2010) |
| 2009 |
| 5 |  | Li-Ming Denq,
Yu-Tsao Hsing,
Cheng-Wen Wu:
Hybrid BIST Scheme for Multiple Heterogeneous Embedded Memories.
IEEE Design & Test of Computers 26(2): 64-73 (2009) |
| 2007 |
| 4 |  | Jing-Jia Liou,
Chih-Tsun Huang,
Cheng-Wen Wu,
Ching-Cheng Tien,
Chi-Hu Wang,
Hsi-Pin Ma,
Ying-Yen Chen,
Yueh-Chih Hsu,
Li-Ming Denq,
Chien-Jung Chiu,
Young-Wey Li,
Chieh-Ming Chang:
A prototype of a wireless-based test system.
SoCC 2007: 225-228 |
| 2004 |
| 3 |  | Kuo-Liang Cheng,
Jing-Reng Huang,
Chih-Wea Wang,
Chih-Yen Lo,
Li-Ming Denq,
Chih-Tsun Huang,
Shin-Wei Hung,
Jye-Yuan Lee:
An SOC Test Integration Platform and Its Industrial Realization.
ITC 2004: 1213-1222 |
| 2 |  | Li-Ming Denq,
Rei-Fu Huang,
Cheng-Wen Wu,
Yeong-Jar Chang,
Wen Ching Wu:
A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories.
MTDT 2004: 65-69 |
| 2003 |
| 1 |  | Rei-Fu Huang,
Li-Ming Denq,
Cheng-Wen Wu,
Jin-Fu Li:
A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories.
MTDT 2003: 53- |