M. Denison

	2005
2		Michael Heer, V. Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Denison, Matthias Stecher, G. Groos: Automated setup for thermal imaging and electrical degradation study of power DMOS devices. Microelectronics Reliability 45(9-11): 1688-1693 (2005)
	2003
1		M. Blaho, Dionyz Pogany, Erich Gornik, M. Denison, G. Groos, Matthias Stecher: Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. Microelectronics Reliability 43(4): 545-548 (2003)

Coauthor Index

1	M. Blaho	[1] [2]
2	Sergey Bychikhin (Scrgey Bychikhin)	[2]
3	V. Dubec	[2]
4	Erich Gornik	[1] [2]
5	G. Groos	[1] [2]
6	Michael Heer	[2]
7	Dionyz Pogany	[1] [2]
8	Matthias Stecher	[1] [2]

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