 | 2011 |
| 5 |  | Ivo Koren,
Ben Schuffenhauer,
Frank Demmerle,
Frank Neugebauer,
Gert Pfahl,
Dirk Rautmann:
Multi-site test of RF transceivers on low-cost digital ATE.
ITC 2011: 1-10 |
| 2010 |
| 4 |  | Frank Poehl,
Frank Demmerle,
Juergen Alt,
Hermann Obermeir:
Production test challenges for highly integrated mobile phone SOCs - A case study.
European Test Symposium 2010: 17-22 |
| 2009 |
| 3 |  | Carsten Wegener,
Heinz Mattes,
Stéphane Kirmser,
Frank Demmerle,
Sebastian Sattler:
Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores.
J. Electronic Testing 25(6): 301-308 (2009) |
| 2007 |
| 2 |  | Ivo Koren,
Frank Demmerle,
Roland May,
Martin Kaibel,
Sebastian Sattler:
FPGA Architecture for RF Transceiver System and Mixed-Signal Low Cost Tests.
European Test Symposium 2007: 43-48 |
| 2006 |
| 1 |  | Frank Demmerle:
Integrated RF-CMOS Transceivers challenge RF Test.
ITC 2006: 1-8 |