E. Deloffre

	2010
2		D. Le Cunff, A. Pravdivtsev, K. Le Chao, C. Euvrard, E. Deloffre, A. Cailean: Use of optical metrology for wafer level packaging of CMOS image sensor. 3DIC 2010: 1-6
	2005
1		E. Deloffre, L. Montès, G. Ghibaudo, S. Bruyère, S. Blonkowski, S. Bécu, M. Gros-Jean, S. Crémer: Electrical properties in low temperature range (5K-300K) of Tantalum Oxide dielectric MIM capacitors. Microelectronics Reliability 45(5-6): 925-928 (2005)

Coauthor Index

1	S. Bécu	[1]
2	S. Blonkowski	[1]
3	S. Bruyère	[1]
4	A. Cailean	[2]
5	K. Le Chao	[2]
6	S. Crémer	[1]
7	D. Le Cunff	[2]
8	C. Euvrard	[2]
9	Gérard Ghibaudo (G. Ghibaudo)	[1]
10	M. Gros-Jean	[1]
11	L. Montès	[1]
12	A. Pravdivtsev	[2]

Colors in the list of coauthors

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