 | 2010 |
|---|
| 8 |       | F. Bertoluzza,
Paolo Cova,
Nicola Delmonte,
P. Pampili,
M. Portesine:
Coupled measurement-simulation procedure for very high power fast recovery - Soft behavior diode design and testing.
Microelectronics Reliability 50(9-11): 1720-1724 (2010) |
| 7 | | Mirko Bernardoni,
Nicola Delmonte,
Paolo Cova,
Roberto Menozzi:
Thermal modeling of planar transformer for switching power converters.
Microelectronics Reliability 50(9-11): 1778-1782 (2010) |
| 2009 |
|---|
| 6 | | F. Bertoluzza,
Nicola Delmonte,
Roberto Menozzi:
Three-dimensional finite-element thermal simulation of GaN-based HEMTs.
Microelectronics Reliability 49(5): 468-473 (2009) |
| 5 | | Mirko Bernardoni,
Paolo Cova,
Nicola Delmonte,
Roberto Menozzi:
Heat management for power converters in sealed enclosures: A numerical study.
Microelectronics Reliability 49(9-11): 1293-1298 (2009) |
| 2008 |
|---|
| 4 | | P. Cova,
Nicola Delmonte,
Roberto Menozzi:
Thermal modeling of high frequency DC-DC switching modules: Electromagnetic and thermal simulation of magnetic components.
Microelectronics Reliability 48(8-9): 1468-1472 (2008) |
| 2007 |
|---|
| 3 | | Nicola Delmonte,
B. E. Watts,
G. Chiorboli,
P. Cova,
Roberto Menozzi:
Test structures for dielectric spectroscopy of thin films at microwave frequencies.
Microelectronics Reliability 47(4-5): 682-685 (2007) |
| 2006 |
|---|
| 2 | | Paolo Cova,
Nicola Delmonte,
Roberto Menozzi:
Thermal characterization and modeling of power hybrid converters for distributed power systems.
Microelectronics Reliability 46(9-11): 1760-1765 (2006) |
| 2005 |
|---|
| 1 | | Paolo Cova,
Nicola Delmonte,
Roberto Menozzi:
On state breakdown in PHEMTs and its temperature dependence.
Microelectronics Reliability 45(9-11): 1605-1610 (2005) |
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