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| 1999 | ||
|---|---|---|
| 1 | Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin: Test and Reliability: Partners in IC Manufacturing, Part 2. IEEE Design & Test of Computers 16(4): 66-73 (1999) | |
| 1 | Charles F. Hawkins | [1] |
| 2 | Jaume Segura | [1] |
| 3 | Jerry M. Soden | [1] |
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