Annelies Delabie

	2005
2		W. Deweerd, Vidya Kaushik, J. Chen, Y. Shimamoto, T. Schram, L.-Å. Ragnarsson, Annelies Delabie, L. Pantisano, B. Eyckens, J. W. Maes: Potential remedies for the VT/Vfb-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey. Microelectronics Reliability 45(5-6): 786-789 (2005)
1		Vidya Kaushik, Martine Claes, Annelies Delabie, Sven Van Elshocht, Olivier Richard, Thierry Conard, Erika Rohr, Thomas Witters, Matty Caymax, Stefan De Gendt: Observation and characterization of defects in HfO2 high-K gate dielectric layers. Microelectronics Reliability 45(5-6): 798-801 (2005)

Coauthor Index

1	Matty Caymax	[1]
2	J. Chen	[2]
3	Martine Claes	[1]
4	Thierry Conard	[1]
5	W. Deweerd	[2]
6	Sven Van Elshocht	[1]
7	B. Eyckens	[2]
8	Stefan De Gendt	[1]
9	Vidya Kaushik	[1] [2]
10	J. W. Maes	[2]
11	L. Pantisano	[2]
12	L.-Å. Ragnarsson	[2]
13	Olivier Richard	[1]
14	Erika Rohr	[1]
15	T. Schram	[2]
16	Y. Shimamoto	[2]
17	Thomas Witters	[1]

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