A. Dehbi

	2005
3		H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Y. Ousten, G. Lekens, A. Dehbi: Failure mechanisms and qualification testing of passive components. Microelectronics Reliability 45(9-11): 1626-1632 (2005)
2		A. Dehbi, Y. Ousten, Y. Danto, W. Wondrak: Vibration lifetime modelling of PCB assemblies using steinberg model. Microelectronics Reliability 45(9-11): 1658-1661 (2005)
	2002
1		A. Dehbi, W. Wondrak, Y. Ousten, Y. Danto: High temperature reliability testing of aluminum and tantalum electrolytic capacitors. Microelectronics Reliability 42(6): 835-840 (2002)

Coauthor Index

1	T. Briolat	[3]
2	Yves Danto (Y. Danto)	[1] [2]
3	R. Humke	[3]
4	G. Lekens	[3]
5	P. Letullier	[3]
6	Y. Ousten (Yves Ousten)	[1] [2] [3]
7	H. A. Post	[3]
8	K. Saarinen	[3]
9	R. Schuhmann	[3]
10	W. Werner	[3]
11	W. Wondrak	[1] [2]

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