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Stefaan Decoutere Coauthor index pubzone.org

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8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLD. Marcon, X. Kang, J. Viaene, M. Van Hove, P. Srivastava, Stefaan Decoutere, R. Mertens, G. Borghs: GaN-based HEMTs tested under high temperature storage test. Microelectronics Reliability 51(9-11): 1717-1720 (2011)
2010
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLWen-Chieh Wang, Zue-Der Huang, Geert Carchon, Abdelkarim Mercha, Stefaan Decoutere, Walter De Raedt, Chung-Yu Wu: 45-nm Planar bulk-CMOS 23-GHz LNAs with high-Q above-IC inductors. ISCAS 2010: 741-744
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLVaidyanathan Subramanian, Abdelkarim Mercha, Bertrand Parvais, Morin Dehan, Guido Groeseneken, Willy M. C. Sansen, Stefaan Decoutere: Identifying the Bottlenecks to the RF Performance of FinFETs. VLSI Design 2010: 111-116
2009
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLStefaan Decoutere, Stefaan Van Huylenbroeck, Bernd Heinemann, Alexander Fox, Pascal Chevalier, Alain Chantre, Thomas Meister, Klaus Aufinger, Michael Schröter: Pushing the speed limits of SiGe: C HBTs up to 0.5 Terahertz. CICC 2009: 347-354
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDimitri Linten, Steven Thijs, Jonathan Borremans, Morin Dehan, D. Trémouilles, Mirko Scholz, M. I. Natarajan, Piet Wambacq, Stefaan Decoutere, Guido Groeseneken: A plug-and-play wideband RF circuit ESD protection methodology: T-diodes. Microelectronics Reliability 49(12): 1440-1446 (2009)
2006
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSteven Thijs, M. Natarajan Iyer, Dimitri Linten, Wutthinan Jeamsaksiri, T. Daenen, Robin Degraeve, Andries Scholten, Stefaan Decoutere, Guido Groeseneken: Implementation of plug-and-play ESD protection in 5.5GHz 90nm RF CMOS LNAs - Concepts, constraints and solutions. Microelectronics Reliability 46(5-6): 702-712 (2006)
2005
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLWutthinan Jeamsaksiri, Abdelkarim Mercha, Javier Ramos, Stefaan Decoutere, Florence Cubaynes: RFCV Test Structure Design for a Selected Frequency Range. IEICE Transactions 88-C(5): 817-823 (2005)
2001
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. Da Rold, Eddy Simoen, Sofie Mertens, Marc Schaekers, G. Badenes, Stefaan Decoutere: Impact of gate oxide nitridation process on 1/f noise in 0.18 mum CMOS. Microelectronics Reliability 41(12): 1933-1938 (2001)

Coauthor Index

1Klaus Aufinger [5]
2G. Badenes [1]
3G. Borghs [8]
4Jonathan Borremans [4]
5Geert Carchon [7]
6Alain Chantre [5]
7Pascal Chevalier [5]
8Florence Cubaynes [2]
9T. Daenen [3]
10Robin Degraeve [3]
11Morin Dehan [4] [6]
12Alexander Fox [5]
13Guido Groeseneken [3] [4] [6]
14Bernd Heinemann [5]
15M. Van Hove [8]
16Zue-Der Huang [7]
17Stefaan Van Huylenbroeck [5]
18M. Natarajan Iyer [3]
19Wutthinan Jeamsaksiri [2] [3]
20X. Kang [8]
21Dimitri Linten [3] [4]
22D. Marcon [8]
23Thomas Meister [5]
24Abdelkarim Mercha [2] [6] [7]
25R. Mertens [8]
26Sofie Mertens [1]
27M. I. Natarajan [4]
28Bertrand Parvais [6]
29Walter De Raedt [7]
30Javier Ramos (Javier Ramos-Lopez) [2]
31M. Da Rold [1]
32Willy M. C. Sansen [6]
33Marc Schaekers [1]
34Andries Scholten [3]
35Mirko Scholz [4]
36Michael Schröter [5]
37Eddy Simoen [1]
38P. Srivastava [8]
39Vaidyanathan Subramanian [6]
40Steven Thijs [3] [4]
41D. Trémouilles (David Trémouilles) [4]
42J. Viaene [8]
43Piet Wambacq [4]
44Wen-Chieh Wang [7]
45Chung-Yu Wu [7]

Colors in the list of coauthors

Last update Tue May 29 01:28:40 2012 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page