Michael G. Davis

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1996

3 Michael G. Davis: The Effect of Periof Generation Techniques on Period Resolution and Waveform Jitter in VLSI Test Systems. ITC 1996: 685-690

1995

2 Michael G. Davis: Evaluating Waveform-Generation Capabilities of VLSI Test Systems. ITC 1995: 469-478

1994

1 Michael G. Davis: Implementation of a Dual-Segment Architecture for a High-Pin-Count VLSI Test System. ITC 1994: 267-272

	1996
3		Michael G. Davis: The Effect of Periof Generation Techniques on Period Resolution and Waveform Jitter in VLSI Test Systems. ITC 1996: 685-690
	1995
2		Michael G. Davis: Evaluating Waveform-Generation Capabilities of VLSI Test Systems. ITC 1995: 469-478
	1994
1		Michael G. Davis: Implementation of a Dual-Segment Architecture for a High-Pin-Count VLSI Test System. ITC 1994: 267-272

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