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R. David Coauthor index pubzone.org

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DBLP keys1997
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLV. Prepin, R. David: Fault coverage of a long random test sequence estimated from a short simulation. VTS 1997: 391-398
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. David, Janusz A. Brzozowski, Helmut Jürgensen: Testing for Bounded Faults in RAMs. J. Electronic Testing 10(3): 197-214 (1997)
1990
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. David: Some Results on Higher Suslin Trees. J. Symb. Log. 55(2): 526-536 (1990)
1984
2no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYves Dallery, R. David: Some New Results on Operational Analysis. Performance 1984: 119-134
1979
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. David, R. Tellez-Giron: Comments on ``The Error Latency of a Fault in a Sequential Digital Circuit''. IEEE Trans. Computers 28(1): 85-86 (1979)

Coauthor Index

1Janusz A. Brzozowski (John Brzozowski) [4]
2Yves Dallery [2]
3Helmut Jürgensen [4]
4V. Prepin [5]
5R. Tellez-Giron [1]

Colors in the list of coauthors

Last update Tue May 29 20:41:18 2012 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page