F. Daugé

	2001
1		F. Dieudonné, F. Daugé, Jalal Jomaah, C. Raynaud, Francis Balestra: An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's. Microelectronics Reliability 41(9-10): 1417-1420 (2001)

Coauthor Index

1	Francis Balestra	[1]
2	F. Dieudonné	[1]
3	Jalal Jomaah	[1]
4	C. Raynaud	[1]

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