 | 2011 |
| 3 |  | Tania Roy,
Yevgeniy S. Puzyrev,
En-xia Zhang,
Sandeepan DasGupta,
Sarah A. Francis,
Daniel M. Fleetwood,
Ronald D. Schrimpf,
Umesh K. Mishra,
Jim S. Speck,
Sokrates T. Pantelides:
1/f Noise in GaN HEMTs grown under Ga-rich, N-rich, and NH3-rich conditions.
Microelectronics Reliability 51(2): 212-216 (2011) |
| 2007 |
| 2 |  | Riaz Naseer,
Jeff Draper,
Younes Boulghassoul,
Sandeepan DasGupta,
Art Witulski:
Critical charge and set pulse widths for combinational logic in commercial 90nm cmos technology.
ACM Great Lakes Symposium on VLSI 2007: 227-230 |
| 1 |  | Riaz Naseer,
Younes Boulghassoul,
Jeff Draper,
Sandeepan DasGupta,
Art Witulski:
Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM.
ISCAS 2007: 1879-1882 |