Tejasvi Das

	2007
9		Tejasvi Das, P. R. Mukund: Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry. DATE 2007: 1277-1282
	2006
8		Tejasvi Das, Ponnathpur R. Mukund: Self-calibration of gain and output match in LNAs. ISCAS 2006
7		Tejasvi Das, Anand Gopalan, Clyde Washburn, P. R. Mukund: Towards Fault-Tolerant RF Front Ends. J. Electronic Testing 22(4-6): 371-386 (2006)
	2005
6		Anand Gopalan, Tejasvi Das, Clyde Washburn, Ponnathpur R. Mukund: Use of source degeneration for non-intrusive BIST of RF front-end circuits. ISCAS (5) 2005: 4385-4388
5		Tejasvi Das, Clyde Washburn, P. R. Mukund, Steve Howard, Ken Paradis, Jung-Geau Jang, Jan Kolnik, Jeff Burleson: Effects of Technology and Dimensional Scaling on Input Loss Prediction of RF MOSFETs. VLSI Design 2005: 295-300
4		Anand Gopalan, Tejasvi Das, Clyde Washburn, P. R. Mukund: An Ultra-Fast, On-Chip BiST for RF Low Noise Amplifiers. VLSI Design 2005: 485-490
	2004
3		Tejasvi Das, Anand Gopalan, Clyde Washburn, P. R. Mukund: Dynamic Input Match Correction in RF Low Noise Amplifiers. DFT 2004: 211-219
2		Ghanshyam Nayak, Tejasvi Das, T. M. Rao, P. R. Mukund: DREAM: A Chip-Package Co-Design Tool for RF-Mixed Signal Systems. ISVLSI 2004: 207-210
1		Tejasvi Das, P. R. Mukund: A Low Noise Current-mode Readout circuit for CMOS Image Sensing Applications. VLSI Design 2004: 635-638

Coauthor Index

1	Jeff Burleson	[5]
2	Anand Gopalan	[3] [4] [6] [7]
3	Steve Howard	[5]
4	Jung-Geau Jang	[5]
5	Jan Kolnik	[5]
6	Ponnathpur R. Mukund (P. R. Mukund)	[1] [2] [3] [4] [5] [6] [7] [8] [9]
7	Ghanshyam Nayak	[2]
8	Ken Paradis	[5]
9	T. M. Rao	[2]
10	Clyde Washburn	[3] [4] [5] [6] [7]

Last update Tue May 29 01:28:40 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page