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| 1991 | ||
|---|---|---|
| 2 | Dharam Vir Das, Sharad C. Seth, Vishwani D. Agrawal: Estimating the Quality of Manufactured Digital Sequential Circuits. ITC 1991: 210-217 | |
| 1990 | ||
| 1 | Dharam Vir Das, Sharad C. Seth, Paul T. Wagner, John C. Anderson, Vishwani D. Agrawal: An experimental study on reject ratio prediction for VLSI circuits: Kokomo revisited. ITC 1990: 712-720 | |
| 1 | Vishwani D. Agrawal | [1] [2] |
| 2 | John C. Anderson | [1] |
| 3 | Sharad C. Seth | [1] [2] |
| 4 | Paul T. Wagner | [1] |
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