Zahari Mohamed Darus

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1999

2 Md. Altaf-Ul-Amin, Zahari Mohamed Darus: VHDL Design of a Test Processor Based on Mixed-Mode Test Generation. Great Lakes Symposium on VLSI 1999: 244-

1998

1 Md. Altaf-Ul-Amin, Zahari Mohamed Darus: An Off-Chip Current Sensor for IDDQ Testing of CMOS ICs. Asian Test Symposium 1998: 318-322

	1999
2		Md. Altaf-Ul-Amin, Zahari Mohamed Darus: VHDL Design of a Test Processor Based on Mixed-Mode Test Generation. Great Lakes Symposium on VLSI 1999: 244-
	1998
1		Md. Altaf-Ul-Amin, Zahari Mohamed Darus: An Off-Chip Current Sensor for IDDQ Testing of CMOS ICs. Asian Test Symposium 1998: 318-322

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