Yisong Dai

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2001

1 Yisong Dai: Generation-recombination noise in bipolar transistors. Microelectronics Reliability 41(6): 919-925 (2001)

	2001
1		Yisong Dai: Generation-recombination noise in bipolar transistors. Microelectronics Reliability 41(6): 919-925 (2001)

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