 | 2011 |
|---|
| 13 |       | Shakeel Ahmad,
Jerzy Dabrowski:
On-chip spectral test for high-speed ADCs by ΣΔ technique.
ECCTD 2011: 661-664 |
| 12 | | Quoc-Tai Duong,
Jerzy Dabrowski:
Low noise transconductance amplifier design for continuous-time ΣΔ wideband frontend.
ECCTD 2011: 825-828 |
| 2010 |
|---|
| 11 | | Shakeel Ahmad,
Kaveh Azizi,
Iman Esmaeil Zadeh,
Jerzy Dabrowski:
Two-tone PLL for on-chip IP3 test.
ISCAS 2010: 3549-3552 |
| 10 | | Rashad Ramzan,
N. Ahsan,
Jerzy Dabrowski:
On-Chip Stimulus Generator for Gain, Linearity, and Blocking Profile Test of Wideband RF Front Ends.
IEEE T. Instrumentation and Measurement 59(11): 2870-2876 (2010) |
| 9 | | Jerzy Dabrowski,
Rashad Ramzan:
Built-in Loopback Test for IC RF Transceivers.
IEEE Trans. VLSI Syst. 18(6): 933-946 (2010) |
| 2007 |
|---|
| 8 | | Jerzy Dabrowski,
Rashad Ramzan:
Interactive presentation: Boosting SER test for RF transceivers by simple DSP technique.
DATE 2007: 719-724 |
| 2006 |
|---|
| 7 | | Rashad Ramzan,
Lei Zou,
Jerzy Dabrowski:
LNA design for on-chip RF test.
ISCAS 2006 |
| 2005 |
|---|
| 6 | | Jerzy Dabrowski,
Javier Gonzalez Bayon:
Techniques for sensitizing RF path under SER test.
ISCAS (5) 2005: 4843-4846 |
| 2004 |
|---|
| 5 | | Jerzy Dabrowski,
Javier Gonzalez Bayon:
Mixed Loopback BiST for RF Digital Transceivers.
DFT 2004: 220-228 |
| 4 | | Jerzy Dabrowski:
Fault modeling of RF blocks based on noise analysis.
ISCAS (1) 2004: 513-516 |
| 2003 |
|---|
| 3 | | Jerzy Dabrowski:
BiST Model for IC RF-Transceiver Front-End.
DFT 2003: 295-302 |
| 1999 |
|---|
| 2 | | Jerzy Dabrowski,
Andrzej Pulka:
Experiences with Modeling of Analog and Mixed A/D Systems Based on PWL Technique.
DATE 1999: 790-791 |
| 1995 |
|---|
| 1 | | Jerzy Dabrowski:
Functional-level analog macromodeling with piecewise linear signals.
EURO-DAC 1995: 222-227 |
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