W. Robert Daasch

	2011
33		Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar: Die-level adaptive test: Real-time test reordering and elimination. ITC 2011: 1-10
	2009
32		Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin: Application of non-parametric statistics of the parametric response for defect diagnosis. ITC 2009: 1-10
31		W. Robert Daasch, Glenn Shirley, Amit Nahar: Statistics in Semiconductor Test: Going beyond Yield. IEEE Design & Test of Computers 26(5): 64-73 (2009)
30		Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch: Multidimensional Test Escape Rate Modeling. IEEE Design & Test of Computers 26(5): 74-82 (2009)
	2008
29		Saurabh Jain, W. Robert Daasch, David Armbrust: Analyzing the Impact of Fault Tolerant BIST for VLSI Design. DFT 2008: 152-160
	2007
28		Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke: Silicon evaluation of longest path avoidance testing for small delay defects. ITC 2007: 1-10
	2006
27		Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware: Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Design & Test of Computers 23(2): 100-109 (2006)
	2005
26		Amit Nahar, W. Robert Daasch, S. Subramaniam: Burn-in reduction using principal component analysis. ITC 2005: 10
25		W. Robert Daasch, Robert Madge: Data-driven models for statistical testing: measurements, estimates and residuals. ITC 2005: 10
24		Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch: The value of statistical testing for quality, yield and test cost improvement. ITC 2005: 10
23		W. Robert Daasch, Robert Madge: Variance reduction and outliers: statistical analysis of semiconductor test data. ITC 2005: 9
22		Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch: Defect Screening Using Independent Component Analysis on I_DDQ. VTS 2005: 427-432
	2004
21		Haiqiao Xiao, Rolf Schaumann, W. Robert Daasch, Phillip K. Wong, Branimir Pejcinovic: A radio-frequency CMOS active inductor and its application in designing high-Q filters. ISCAS (4) 2004: 197-200
20		W. Robert Daasch, Manu Rehani: Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester. ITC 2004: 1428
19		Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler: In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212
18		Chris Schuermyer, Jens Ruffler, W. Robert Daasch: Minimum Testing Requirements to Screen Temperature Dependent Defects. ITC 2004: 300-308
17		Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware: Detection of Temperature Sensitive Defects Using ZTC. VTS 2004: 185-192
	2003
16		Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning: Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC 2003: 565-573
15		Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch: Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS 2003: 39-46
14		Robert Madge, Brady Benware, W. Robert Daasch: Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Design & Test of Computers 20(5): 46-53 (2003)
	2002
13		Chee How Lim, W. Robert Daasch, George Cai: A Thermal-Aware Superscalar Microprocessor (invited). ISQED 2002: 517-522
12		W. Robert Daasch, Kevin Cota, James McNames, Robert Madge: Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. ITC 2002: 1240
11		David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge: Isolating and Removing Sources of Variation in Test Data. ITC 2002: 464-471
10		Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner: Screening MinVDD Outliers Using Feed-Forward Voltage Testing. ITC 2002: 673-682
9		Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch: Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. VTS 2002: 69-74
8		Ali Keshavarzi, James Tschanz, Siva Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins: Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Design & Test of Computers 19(5): 36-43 (2002)
7		W. Robert Daasch, James McNames, Robert Madge, Kevin Cota: Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort. IEEE Design & Test of Computers 19(5): 74-81 (2002)
	2001
6		W. Robert Daasch, Kevin Cota, James McNames, Robert Madge: Neighbor selection for variance reduction in I_DDQ and other parametric data. ITC 2001: 92-100
	2000
5		W. Robert Daasch, James McNames, Daniel Bockelman, Kevin Cota: Variance reduction using wafer patterns in I_ddQ data. ITC 2000: 189-198
4		Ashutosh S. Dhodapkar, Chee How Lim, George Cai, W. Robert Daasch: TEM2P2EST: A Thermal Enabled Multi-model Power/Performance ESTimator. PACS 2000: 112-125
	1995
3		Michael A. Driscoll, W. Robert Daasch: Accurate Predictions of Parallel Program Execution Time. J. Parallel Distrib. Comput. 25(1): 16-30 (1995)
	1993
2		Pan Wu, Rolf Schaumann, W. Robert Daasch: A 20 MHz Fully-balanced Transconductance-C Filter in 2 µm CMOS Technology. ISCAS 1993: 1188-1191
	1987
1		William A. Payne III, Fillia Makedon, W. Robert Daasch: High Speed Interconnection Using the Clos Network. ICS 1987: 96-111

Coauthor Index

1	David Abercrombie	[11]
2	David Armbrust	[29]
3	Brady Benware	[14] [15] [16] [17] [19] [22] [24] [27]
4	Daniel Bockelman	[5]
5	Kenneth M. Butler	[30] [33]
6	George Cai	[4] [13]
7	John M. Carulli Jr.	[30] [33]
8	Kevin Cota	[5] [6] [7] [9] [12] [16]
9	Vivek De (Vivek K. De)	[8]
10	Ashutosh S. Dhodapkar	[4]
11	Michael A. Driscoll	[3]
12	B. H. Goh	[10]
13	Kapil R. Gotkhindikar	[33]
14	Rama Gudavalli	[32]
15	Charles F. Hawkins	[8]
16	Douglas Heaberlin	[32]
17	Saurabh Jain	[29]
18	Ali Keshavarzi	[8]
19	Chee How Lim	[4] [13]
20	Ethan Long	[17]
21	Cam Lu	[15]
22	Joel Lurkins	[27]
23	C. Macchietto	[10]
24	Robert Madge	[6] [7] [9] [10] [11] [12] [14] [15] [16] [17] [19] [22] [23] [24] [25]
25	Fillia Makedon	[1]
26	James McNames	[5] [6] [7] [11] [12]
27	Amit Nahar	[26] [30] [31] [33]
28	Siva Narendra	[8]
29	Phil Nigh	[32]
30	L. Ning	[16]
31	William A. Payne III	[1]
32	Branimir Pejcinovic	[21]
33	V. Rajagopalan	[10]
34	Manu Rehani	[9] [20]
35	Kaushik Roy	[8]
36	Jens Ruffler	[18] [19]
37	Manoj Sachdev	[8]
38	Jayashree Saxena	[30]
39	Rolf Schaumann	[2] [21]
40	Chris Schuermyer	[10] [16] [18] [19]
41	Thaddeus T. Shannon	[22]
42	Glenn Shirley	[31]
43	John Van Slyke	[28]
44	S. Subramaniam	[26]
45	C. Taylor	[10]
46	James Tschanz (James W. Tschanz)	[8]
47	Ritesh P. Turakhia	[19] [22] [27] [28]
48	David Turner	[10] [11]
49	Mark Ward	[24] [28]
50	Phillip K. Wong	[21]
51	Pan Wu	[2]
52	Haiqiao Xiao	[21]

Colors in the list of coauthors

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page