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Carlos H. Díaz Coauthor index pubzone.org

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DBLP keys1994
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLCarlos H. Díaz, Sung-Mo Kang, Charvaka Duvvury: Circuit-level electrothermal simulation of electrical overstress failures in advanced MOS I/O protection devices. IEEE Trans. on CAD of Integrated Circuits and Systems 13(4): 482-493 (1994)
1993
3no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLCarlos H. Díaz, Charvaka Duvvury, Sung-Mo Kang: Thermal Failure Simulation for Electrical Overstress in Semiconductor Devices. ISCAS 1993: 1389-1392
1992
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLCarlos H. Díaz, Sung-Mo Kang: New algorithms for circuit simulation of device breakdown. IEEE Trans. on CAD of Integrated Circuits and Systems 11(11): 1344-1354 (1992)
1991
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLCarlos H. Díaz, Sung-Mo Kang, Yusuf Leblebici: An accurate analytical delay model for BiCMOS driver circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 10(5): 577-588 (1991)

Coauthor Index

1Charvaka Duvvury [3] [4]
2Sung-Mo Kang [1] [2] [3] [4]
3Yusuf Leblebici [1]

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