Alejandro Czutro

	2012
13		Matthias Sauer, Stefan Kupferschmid, Alejandro Czutro, Sudhakar M. Reddy, Bernd Becker: Analysis of Reachable Sensitisable Paths in Sequential Circuits with SAT and Craig Interpolation. VLSI Design 2012: 382-387
	2011
12		Matthias Sauer, Jie Jiang, Alejandro Czutro, Ilia Polian, Bernd Becker: Efficient SAT-Based Search for Longest Sensitisable Paths. Asian Test Symposium 2011: 108-113
11		Matthias Sauer, Alejandro Czutro, Ilia Polian, Bernd Becker: Estimation of component criticality in early design steps. IOLTS 2011: 104-110
	2010
10		Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability Analysis. International Journal of Parallel Programming 38(3-4): 185-202 (2010)
	2009
9		Alejandro Czutro, Ilia Polian, Piet Engelke, Sudhakar M. Reddy, Bernd Becker: Dynamic Compaction in SAT-Based ATPG. Asian Test Symposium 2009: 187-190
8		Marc Hunger, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, Bernd Becker: ATPG-based grading of strong fault-secureness. IOLTS 2009: 269-274
7		Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker: TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis. VLSI Design 2009: 227-232
6		Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker: An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. VTS 2009: 21-26
	2008
5		Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker: A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. European Test Symposium 2008: 113-118
	2007
4		Ilia Polian, Alejandro Czutro, Bernd Becker: Evolutionary Optimization in Code-Based Test Compression CoRR abs/0710.4670: (2007)
3		Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd Becker: Power Droop Testing. IEEE Design & Test of Computers 24(3): 276-284 (2007)
	2006
2		Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd Becker: Power Droop Testing. ICCD 2006
	2005
1		Ilia Polian, Alejandro Czutro, Bernd Becker: Evolutionary Optimization in Code-Based Test Compression. DATE 2005: 1124-1129

Coauthor Index

1	Bernd Becker	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13]
2	Mariane Comte	[5] [6]
3	Piet Engelke	[5] [6] [7] [9] [10]
4	Sybille Hellebrand	[8]
5	Nicolas Houarche	[5] [6]
6	Marc Hunger	[8]
7	Jie Jiang	[12]
8	Sandip Kundu	[2] [3]
9	Stefan Kupferschmid	[13]
10	Matthew D. T. Lewis	[7] [10]
11	Ilia Polian	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12]
12	Sudhakar M. Reddy	[7] [9] [10] [13]
13	Michel Renovell	[5] [6]
14	Matthias Sauer	[11] [12] [13]

Last update Tue May 29 01:28:40 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page