 | 2007 |
|---|
| 4 |       | Giuseppe Currò,
Marco Camalleri,
Denise Calì,
Francesca Monforte,
Fortunato Neri:
Carrier trapping in thin N2O-grown oxynitride/oxide di-layer for PowerMOSFET devices.
Microelectronics Reliability 47(4-5): 798-801 (2007) |
| 3 | | Giacomo Barletta,
Giuseppe Currò:
Evaluation of the generation mechanisms at surface and in the bulk of the silicon by current transient technique.
Microelectronics Reliability 47(4-5): 810-814 (2007) |
| 2 | | Giuseppe Currò,
Marco Camalleri,
Denise Calì,
Francesca Monforte,
Fortunato Neri:
Interface states and traps in thin N2O-grown oxynitride/oxide di-layer for PowerMOSFET devices.
Microelectronics Reliability 47(4-5): 819-821 (2007) |
| 2005 |
|---|
| 1 | | Giacomo Barletta,
Giuseppe Currò:
Junction leakage current degradation under high temperature reverse-bias stress induced by band-defect-band tunnelling in power VDMOS.
Microelectronics Reliability 45(5-6): 994-999 (2005) |
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