F. N. Cubaynes

	2001
1		B. J. O'Sullivan, P. K. Hurley, F. N. Cubaynes, P. A. Stolk, F. P. Widdershoven: Flat band voltage shift and oxide properties after rapid thermal annealing. Microelectronics Reliability 41(7): 1053-1056 (2001)

Coauthor Index

1	P. K. Hurley	[1]
2	B. J. O'Sullivan	[1]
3	P. A. Stolk	[1]
4	F. P. Widdershoven	[1]

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